GPI-300 has several distinctive features allowing to
use it easily in a combination with other methods of the analysis or technology
in ultrahigh vacuum. In particular,
- The application of piezo-inertial system for a tip to sample approach
has allowed to create the scanner with "open architecture". It, in turn,
gives a basic opportunity to influence on a surface by molecular, laser,
electron or ion beams and to analyse the appropriate characteristics
of a surface simultaneously with STM images obtaining.
- The uniform standard of the tip and sample holders allows to use
a uniform way for their transportation inside vacuum set-up. The system
of transportation uses standard, commercially available XYZ- and linear
manipulators. It allows easily to build STM in existing technological
and analytical ultrahigh vacuum chambers. Small STM chamber also can
be attached to any vacuum set-up, in which transport of samples is made,
as a rule, by means of linear manipulators.
- The verified technology of cleaning and sharpening of STM probes by
ion bombardment in vacuum, guarantees to deliver sharp, atomically-clean
probes to the scanner. The restoration of a probe, spoiled during scanning,
can be made in situ as well.
- Besides analytical opportunities, such as actually microscopy and
spectroscopy, the GPI-300 has function of local modification of a surface
with the help of the STM-probe.