GPI-300 has several distinctive features allowing to use it easily in a combination with other methods of the analysis or technology in ultrahigh vacuum. In particular,

• The application of piezo-inertial system for a tip to sample approach has allowed to create the scanner with "open architecture". It, in turn, gives a basic opportunity to influence on a surface by molecular, laser, electron or ion beams and to analyse the appropriate characteristics of a surface simultaneously with STM images obtaining.
• The uniform standard of the tip and sample holders allows to use a uniform way for their transportation inside vacuum set-up. The system of transportation uses standard, commercially available XYZ- and linear manipulators. It allows easily to build STM in existing technological and analytical ultrahigh vacuum chambers. Small STM chamber also can be attached to any vacuum set-up, in which transport of samples is made, as a rule, by means of linear manipulators.
• The verified technology of cleaning and sharpening of STM probes by ion bombardment in vacuum, guarantees to deliver sharp, atomically-clean probes to the scanner. The restoration of a probe, spoiled during scanning, can be made in situ as well.
• Besides analytical opportunities, such as actually microscopy and spectroscopy, the GPI-300 has function of local modification of a surface with the help of the STM-probe.